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Compact Reconnaissance Imaging Spectrometer for Mars (CRISM) Stamp Layer

The CRISM Stamp Layer will display stamps for all observations acquired by the Compact Reconnaissance Imaging Spectrometer for Mars (CRISM) onboard the Mars Reconnaissance Orbiter. While the search interface is similar to the THEMIS Stamp Layer, there are some differences that allow users to search for observations based on the unique parameters associated with CRISM observations.

Image:crims_stamps.png

Open the CRISM Stamp Layer

  1. Open the Stamp Layer: Chose "Add New Layer" -> Click the drop-down menu and select "Imagery" -> Make sure "Image Sets" is selected and click "CRISM".
  1. Search Parameter Categories: The search parameters are divided into categories since there are so many of them. Clicking on the down arrow on the right side of the category name will reveal all the search parameters in that category. The categories are:
    • Basic Parameters
    • Observation Parameters
    • Science Parameters
    NOTE: A search can be performed with parameters from multiple categories.
  1. Enter Search Parameters: It is not necessary to enter values for each parameter, but the more specific your search the faster it will be. The allowable values for each field are given in the quick reference table below followed by more detailed descriptions of each search parameter. You can also click "Set Lon/Lat to bounds of View" to view only the stamps that are in the Mainview. This will be faster than loading all of the stamps that are available.
  1. Perform Image Search: Clicking OK will make the Stamp Layer perform the search and display the results. Depending on how specific the search parameters are, it may take the Stamp Layer a few minutes to find and create stamps for all of the images. Once the stamps are displayed in the Viewing Window, users can right-click on an outline to view the image in a web browser. A rendering option for CRISM stamps is in the works, stay tuned!

 

Image:stamps_crismquery.png
Video Tutorial: How to use the Stamp Layer
CRISM Search Parameter Glossary

Filter Type

Acceptable Values

Description
Basic Parameters

Image ID(s)

Any Specific Image ID Number(s)

A unique identifier for each image commanded; follows the pattern CCCnnnnnnnn_tt_AAaaaS_FFFv.(Ext), where:

  • CCC is a 3-digit observation type
    • FRT (Full Resolution Targeted Observation)
    • HRL (Half Resolution Long Targeted Observation)
    • HRS (Half Resolution Short Targeted Observation)
    • ASE (Atmospheric Survey EPF)
    • MSS (Multispectral Survey, lossy compressed)
    • MSP (Multispectral Survey, losslessly compressed)
    • MSW (Multispectral Window)
    • CAL (Radiometric Calibration)
    • FFC (Flat Field Calibration)
    • ICL (Calibration source intercalibration)
    • STO (Star Observation)
    • FUN (Functional test)
    • UNK (no valid EDRs within observation to indicate type)
  • nnnnnnnn is an 8 digit image number, expressed in hexadecimal format
  • tt is a 2-digit number that counts the EDRs from a single observations, expressed in hex
  • AAaaa is a designation for the activity type and the associated macro
    • EDR - Experimental Data Record
      • BI### - Bias measurements / Macro#
      • DF### - Dark field measurements / Macro#
      • LP### - Lamp measurements / Macro #
      • SP### - Sphere measurements / Macro #
      • SC### - Scene measurements / Macro #
      • T1### - Focal plane electronics test pattern 1 / Macro #
      • T2### - Focal plane electronics test pattern 2 / Macro #
      • T3### - Focal plane electronics test pattern 3 / Macro #
      • T4### - Focal plane electronics test pattern 4 / Macro #
      • T5### - Focal plane electronics test pattern 5 / Macro #
      • T6### - Focal plane electronics test pattern 6 / Macro #
      • T7### - Focal plane electronics test pattern 7 / Macro #
      • UN### - Instrument configuration does not match macro library / Macro #
    • TRDR - Targeted Reduced Data Record
      • RA### - Radiance / Macro#
      • SU### - Summary Products / Macro #
      • IF### - I/F / Macro #
      • AL### - Lambert albedo / Macro #
    • DDR - Derived Data Record
      • DE### - Derived product / Macro#
  • S is the sensor ID
    • S - Short
    • L - Long
    • J - Joint
  • FFF is the file type
    • EDR
    • DDR
    • TRR
    • RTR
  • v is the version numer, expressed as 0-9 then a-z.

Observation Type

MSW - Multispectral Window
MSP - Multispectral Survey - Losslessly Compressed
MSS - Multispectral Survey - Lossy Compressed
TOD - Tracking Optical Depth
FRT - Full Resolution Targeted Observation
HRL - Half-Resolution Long Targeted Observation
HRS - Half-Resolution Short Targeted Observation
EPF - Emission Phase Function
Blank - Any Observation Types

 The type of observation being made, specified by resolution, number of bands and compression.

Wavelength

S - Short Sensor
L - Long Sensor
Blank - Any Sensors

 Specifies whether the observation was a VNIR observation (Short) or an IR observation (L).

Min/Max Longitude

0 to 360(East Longitude = Positive)
Blank(Any Longitude)

 This is the approximate longitude on the planet Mars of the image center. All values are based on the IAU 2000 aerocentric model of Mars with east positive longitude. (gives in degrees of East Longitude)

Min/Max Latitude

90 to -90(North Latitude = Positive)
Blank(Any Latitude)

 This is the approximate latitude on the planet Mars of the image center. All values are based on the IAU 2000 aerocentric model of Mars with north positive latitude.
Advanced Parameters

Product Type

Targeted RDR
Blank(Any Product Type)

 Currently, only CRISM targeted RDRs are available in JMARS.

Volume

MROCR_2001
MROCR_2002
MROCR_2003
MROCR_2004
MROCR_2005
MROCR_2006
MROCR_2007
MROCR_2008
Blank(Any Data Release Volume)

 CRISM data has been divided into volumes for delivery to the Planetary Data System (PDS).

Lines

0 - 5400
Blank(Any Number of Lines)

 The number of cross-track pixels acquired by the instrument.

Line Samples

0 - 640
Blank(Any Number of Line Samples)

 The number of along-track pixels acquired by the instrument.

Pixel Averaging Width

1
2
5
10
Blank(Any Pixel Averaging Width)

 The horizontal dimension, in pixels, of the area over which pixels were averaged prior to image compression.

Instrument Pointing Mode

Dynamic Pointing
Fixed Pointing
Blank(Any Instrument Pointing Mode)

 CRISM can acquire data in either a fixed position mode or a dynamic mode that tracks a location on the surface to increase total integration time.

Scan Mode

EPF (Atmospheric Observations)
Long
Short
Blank(Any Scan Mode)

 The internal data acquisition rate used for acquiring the observation.

Frame Rate

1.00
3.75
5.00
15.0
30.0
Blank (Any Frame Rate)

 The rate at which frames of data in a CRISM EDR were returned.

Exposure

1 - 480
Blank (Any Exposure)

 The commanded instrument exposure time for the given observation.

Sampling Mode

Hyperspectral
Multispectral
Blank(Any Sampling Mode)

 The resolution mode of a wavelength of frequency channel.

Wavelength Filter

0
1
2
3
Blank(Any Wavelength Filter)

 Identifies which of the four CRISM onboard menus of rows was selected for downlink.

Detector Temperature

-170C to -50C
Blank(Any Detector Temperature)

 The temperature of the sensors.

Optical Bench Temperature

-60C to -40C
Blank(Any Optical Bench Temperature)

 The temperature of the optical bench.

Spectrometer Housing Temperature

-80C to -60C
Blank(Any Spectrometer Housing Temperature)

 The temperature of the spectrometer housing.

Sphere Temperature

-60C to -40C
Blank(Any Sphere Temperature)

 The temperature of the onboard integrating sphere.

IR Focal Plane Electronics Temperature

-3C to 8C
Blank(Any FPE Temperature)

 The temperature of the IR focal plane electronics (if Sensor_ID = L) or the VNIR focal plane electronics (if Sensor_ID = S).

Bands

1 - 438
Blank(Any Number of Bands)

 The number of spectral bands in an image or other data product.
Science Parameters

Solar Distance

205,000,000km - 250,000,000km
Blank(Any Solar Distance)

 The distance from the center of the sun to the center of the target body.

Year

2006 - 2009
Blank(Any Earth Year)

 Earth year during which the observation was acquired.

Day of Year

1 - 366
Blank(Any Earth Day of Year)

 Earth day-of-year during which the observation was acquired.

Min/Max Incidence Angle

0 - 180(0 = Sun Directly Overhead)
Blank(Any Incidence Angle)

 Derived for the center of the image, this is the angle between the Sun and a "normal" drawn perpendicular to the planet's surface at the time the image was acquired. A higher incidence angle means that a person standing on the ground would see the sun lower toward the horizon.

Min/Max Emission Angle

0 - 180(0 = CRISM Directly Overhead)
Blank(Any Emission Angle)

 Measured from the center of the image, this is the angle between the CTX and a "normal" drawn perpendicular to the planet's surface.

Min/Max Phase Angle

0 - 180(0 = CRISM and Sun In-Line)
Blank(Any Phase Angle)

 This is the angle between the sun, the surface, and the CTX at the time the picture was obtained.

MOLA Slope

0 - 360(Azimuth Degrees Clockwise from North)
Blank(Any MOLA Slope)

 The average magnitude of the MOLA slopes, in deg, within the observation footprint.

MOLA Elevation

-10 - 15 (in km)
Blank(Any MOLA Elevation)

 The average MOLA elevation within the observation footprint.

Solar Time

00:00 - 24:00 (Given as HH:MM in Mars time)
Blank(Any Solar Time)

 This is the local solar time on Mars at the center of the image relative to a division of the martian day into 24 equal parts. A martian day is slightly longer than 24 hours and 37 minutes long.

Stamp Layer Functions

The CRISM Stamp Layer's functions are identical to the functions of the Stamp Layer and are explained in detail on the Stamp Layer page.